Semi-supervised imbalanced classification of wafer bin map defects using a Dual-Head CNN.
Siyamalan ManivannanPublished in: Expert Syst. Appl. (2024)
Keyphrases
- semi supervised
- supervised learning
- decision trees
- feature extraction
- feature vectors
- class imbalance
- unsupervised learning
- classification accuracy
- machine learning
- semi supervised classification
- semi supervised learning
- text classification
- image classification
- feature space
- pattern recognition
- support vector
- binary classification problems
- support vector machine svm
- convolutional neural network
- feature selection
- data sets
- co training
- supervised classification
- high dimensionality
- fully supervised
- semi supervised learning algorithms
- imbalanced data sets
- labeled and unlabeled data
- learning algorithm
- support vector machine
- training samples
- labeled data
- training set
- pairwise
- multi class