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Accelerated Life Tests of a Series System With Masked Interval Data Under Exponential Lifetime Distributions.
Tsai-Hung Fan
Tsung-Ming Hsu
Published in:
IEEE Trans. Reliab. (2012)
Keyphrases
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interval data
minmax regret
shortest path problem
data clustering
probability distribution
temporal data
multivariate data
random variables
machine learning
cost function
shortest path