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Accelerated Life Tests of a Series System With Masked Interval Data Under Exponential Lifetime Distributions.

Tsai-Hung FanTsung-Ming Hsu
Published in: IEEE Trans. Reliab. (2012)
Keyphrases
  • interval data
  • minmax regret
  • shortest path problem
  • data clustering
  • probability distribution
  • temporal data
  • multivariate data
  • random variables
  • machine learning
  • cost function
  • shortest path