Slit-Mura Detection through Non-contact Optical Measurements of In-Line Spectrometer for TFT-LCDs.

Fu-Ming Tzu Jung-Hua Chou

Published in: IEICE Trans. Electron. (2009)

Keyphrases

liquid crystal displays
thin film transistor
image formation
tft lcd
high resolution
motion blur
higher resolution
eye tracking
thin film
optical properties
object detection
computer vision
super resolution
spectral data
infrared
signal processing
line detection
face images
high quality