A method for quick estimation of optimum bulk bias voltages for SoC designs.
Lucas SantisRonald ValenzuelaPublished in: LASCAS (2016)
Keyphrases
- significant improvement
- computational cost
- high accuracy
- pairwise
- objective function
- high precision
- experimental evaluation
- probabilistic model
- optimization algorithm
- clustering method
- model selection
- maximum likelihood estimation
- synthetic data
- detection method
- neural network
- segmentation algorithm
- segmentation method
- optimal solution
- optimization method
- feature extraction