A classification of binary systematic codes of small defect
Alberto RavagnaniPublished in: CoRR (2012)
Keyphrases
- image classification
- classification accuracy
- pattern recognition
- classification method
- classification systems
- decision trees
- small number
- object classification
- classification process
- classification algorithm
- machine learning
- support vector machine
- feature extraction
- multi class svm
- support vector machine svm
- decision rules
- feature selection
- binary classifiers
- non binary
- classification rate
- cross validation
- classification scheme
- automatic classification
- classification models
- benchmark datasets
- support vector
- learning algorithm