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Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology.
Sourindra M. Chaudhuri
Prateek Mishra
Niraj K. Jha
Published in:
ACM J. Emerg. Technol. Comput. Syst. (2014)
Keyphrases
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response surface methodology
prediction model
neural network