Login / Signup

Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology.

Sourindra M. ChaudhuriPrateek MishraNiraj K. Jha
Published in: ACM J. Emerg. Technol. Comput. Syst. (2014)
Keyphrases
  • response surface methodology
  • prediction model
  • neural network