Semiconductor defect classification using hyperellipsoid clustering neural networks and model switching.
Keisuke KameyamaYukio KosugiPublished in: IJCNN (1999)
Keyphrases
- neural network
- computational model
- multi layer
- probabilistic model
- training data
- hybrid model
- neural network model
- theoretical analysis
- management system
- prior knowledge
- data sets
- mathematical model
- statistical model
- experimental data
- network structure
- conceptual model
- artificial neural networks
- formal model
- pattern recognition
- similarity measure