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Statistical Modeling With the PSP MOSFET Model.

Xin LiColin C. McAndrewWeimin WuSamir ChaudhryJames VictoryGennady Gildenblat
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
  • statistical modeling
  • statistical models
  • parameter estimation
  • experimental data
  • high level
  • management system
  • computational model
  • mathematical model
  • statistical model
  • computer vision
  • similarity measure
  • multiscale