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SiSMA-a tool for efficient analysis of analog CMOS integrated circuits affected by device mismatch.

Giorgio BiagettiSimone OrcioniClaudio TurchettiPaolo CrippaMichele Alessandrini
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
  • integrated circuit
  • analysis tool
  • data analysis
  • high speed
  • genetic algorithm
  • image analysis
  • cost effective
  • parallel processing
  • efficient implementation
  • circuit design
  • analog vlsi
  • metal oxide semiconductor