Application of Multi-Descriptor Binary Shape Analysis for Classification of Electronic Parts.
Kamil MalinskiKrzysztof OkarmaPublished in: J. Univers. Comput. Sci. (2020)
Keyphrases
- shape analysis
- shape descriptors
- image analysis and pattern recognition
- pattern spectra
- machine learning
- pattern recognition
- shape representation
- feature vectors
- fourier descriptors
- medical imaging
- feature extraction
- euclidean space
- feature space
- semi supervised
- three dimensional
- shape matching
- shape recognition
- closed curves
- preserving transformations