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Deep Learning-Aided Optical IM/DD OFDM Approaches the Throughput of RF-OFDM.
Thien Van Luong
Xiaoyu Zhang
Luping Xiang
Tiep Minh Hoang
Chao Xu
Periklis Petropoulos
Lajos Hanzo
Published in:
IEEE J. Sel. Areas Commun. (2022)
Keyphrases
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deep learning
unsupervised learning
deep architectures
machine learning
unsupervised feature learning
data mining
information retrieval
computer vision
pattern recognition
wireless communication
automatic extraction