A rapid dither algorithm advances A/D converter testing.
Jack WeimerKevin BaadeJohn FitzsimmonsBrian LowePublished in: ITC (1990)
Keyphrases
- optimal solution
- computational cost
- improved algorithm
- learning algorithm
- objective function
- computational complexity
- theoretical analysis
- detection algorithm
- high accuracy
- probabilistic model
- optimization algorithm
- cost function
- search space
- preprocessing
- mathematical model
- tree structure
- experimental evaluation
- dynamic programming
- significant improvement
- k means
- similarity measure
- worst case
- np hard
- multi objective
- classification algorithm
- convergence rate