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A beta model for estimating the testability and coverage distributions of a VLSI circuit.
Hassan A. Farhat
Steven G. From
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
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probability distribution
computational model
high level
prior knowledge
management system
real time
data sets
probabilistic model
high speed
statistical model
neural network
genetic algorithm
cost function
parameter estimation
theoretical framework