Login / Signup

RF passive device modeling and characterization in 65nm CMOS technology.

Errikos LourandakisStefanos StefanouKonstantinos NikellisSotiris Bantas
Published in: ISQED (2013)
Keyphrases
  • cmos technology
  • low power
  • silicon on insulator
  • spl times
  • parallel processing
  • power consumption
  • low voltage
  • low cost
  • power dissipation
  • real time
  • computer vision
  • high speed
  • image sensor