A radiation-hardened DLL with fine resolution and DCC for DDR2 memory interface in 0.13 μm CMOS.
Siyu YangDeping HuangXiaoke WenLei ChenJinghong ChenPublished in: ISCAS (2013)
Keyphrases
- high speed
- x ray
- memory requirements
- infrared
- user interface
- computing power
- user friendly
- memory usage
- high resolution
- power consumption
- random access memory
- analog vlsi
- low power
- low cost
- interface design
- memory size
- direct manipulation
- vlsi circuits
- multiscale
- power supply
- circuit design
- coarse to fine
- constraint programming
- low resolution