Process modeling and simulation: boundary conditions for point defect-based impurity diffusion model.
Kenji TaniguchiYoshiaki ShibataChihiro HamaguchiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- boundary conditions
- diffusion model
- reaction diffusion
- boundary value problem
- finite element method
- finite element model
- diffusion process
- navier stokes equations
- sufficient conditions
- numerical simulations
- variational inequalities
- video data
- state space
- object recognition
- high quality
- poisson equation
- image processing