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Special Section in IEEE Transactions on Instrumentation and Measurement on Biometric Instrumentation and Measurement.

Fabio ScottiDavid Zhang
Published in: IEEE Trans. Instrum. Meas. (2010)
Keyphrases
  • special section
  • pattern recognition
  • data acquisition
  • database
  • real time
  • databases
  • information retrieval
  • feature extraction