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Mixed-Type Wafer Defect Pattern Recognition Framework Based on Multifaceted Dynamic Convolution.
Yuxiang Wei
Huan Wang
Published in:
IEEE Trans. Instrum. Meas. (2022)
Keyphrases
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pattern recognition
image processing
image analysis
neural network
data mining
lightweight
main contribution
databases
computer vision
data structure
support vector machine svm
theoretical framework
image reconstruction
conceptual framework
dynamically select