Mixed-Type Wafer Defect Pattern Recognition Framework Based on Multifaceted Dynamic Convolution.

Yuxiang Wei Huan Wang

Published in: IEEE Trans. Instrum. Meas. (2022)

Keyphrases

pattern recognition
image processing
image analysis
neural network
data mining
lightweight
main contribution
databases
computer vision
data structure
support vector machine svm
theoretical framework
image reconstruction
conceptual framework
dynamically select