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A small sample model selection criterion based on Kullback's symmetric divergence.

Abd-Krim SeghouaneMaïza Bekara
Published in: IEEE Trans. Signal Process. (2004)
Keyphrases
  • small sample
  • sample size
  • high dimensional
  • support vector machine
  • feature selection
  • ls svm
  • pattern recognition
  • feature vectors
  • feature selection algorithms
  • similarity measure
  • computational complexity