Facile chemical method of etching polyimide films for failure analysis (FA) applications and its etching mechanism studies.
Chien-Pan LiuJeng-Yu LinYen-Fu LiuShoou-Jinn ChangPublished in: Microelectron. Reliab. (2014)
Keyphrases
- preprocessing
- cost function
- experimental evaluation
- theoretical analysis
- high accuracy
- detection method
- learning mechanism
- segmentation method
- significant improvement
- support vector machine
- fully automatic
- three dimensional
- image processing
- neural network
- probabilistic model
- input data
- computer simulation
- wireless sensor networks
- optimization algorithm
- pairwise
- similarity measure
- classification method