Modular HPC I/O Characterization with Darshan.
Shane SnyderPhilip H. CarnsKevin HarmsRobert B. RossGlenn K. LockwoodNicholas J. WrightPublished in: ESPT@SC (2016)
Keyphrases
- input output
- high performance computing
- fault tolerance
- file system
- scientific computing
- storage systems
- database
- modular structure
- response time
- axiomatic characterization
- garbage collection
- external memory
- massively parallel
- load balancing
- management system
- data model
- artificial intelligence
- information retrieval
- data mining