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Breaking nyquist limitations in reflectometry-based wire diagnosis systems by compressive sampling.

Tzila AjamianSaïd MoussaouiAntoine Dupret
Published in: IEEE Instrum. Meas. Mag. (2019)
Keyphrases
  • data sets
  • image processing
  • multiscale
  • pattern recognition
  • high dimensional
  • high dimensional data