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Revisiting Safe Operating Area: SiGe HBT Aging Models for Reliability-Aware Circuit Design.

Brian R. WierRafael Perez MartinezUppili S. RaghunathanHanbin YingSaeed ZeinolabedinzadehJohn D. Cressler
Published in: BCICTS (2018)
Keyphrases
  • circuit design
  • learning algorithm
  • mathematical models
  • data sets
  • object oriented
  • low cost
  • high speed
  • parameter estimation