Yield and power improvement method by post-silicon delay tuning and technology mapping.
Hayato MashikoYukihide KohiraPublished in: APCCAS (2016)
Keyphrases
- high accuracy
- case study
- objective function
- fine tuning
- synthetic data
- pairwise
- significant improvement
- support vector machine
- computational cost
- classification method
- detection method
- classification accuracy
- cost function
- color images
- neural network
- data sets
- input data
- optimization algorithm
- detection algorithm
- clustering method
- bayesian networks
- similarity measure
- clustering algorithm