Semi-supervised rotation-invariant representation learning for wafer map pattern analysis.

Hyungu Kang Seokho Kang

Published in: Eng. Appl. Artif. Intell. (2023)

Keyphrases

pattern analysis
rotation invariant
semi supervised
learning algorithm
pattern recognition
machine learning
multiscale
image analysis
data points
genetic algorithm
artificial intelligence
similarity measure
feature vectors