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Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning.
Zhenbao Liu
Zhen Jia
Chi-Man Vong
Shuhui Bu
Junwei Han
Xiaojun Tang
Published in:
IEEE Trans. Ind. Informatics (2017)
Keyphrases
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deep learning
unsupervised feature learning
feature extraction
unsupervised learning
feature vectors
feature set
decision trees
feature space
image features
co occurrence
weakly supervised
probabilistic model
training examples
object model
restricted boltzmann machine