Discrepancy as a quality measure for avoiding classification bias.
Kazunori IwataNaohiro IshiiPublished in: ISIC (2002)
Keyphrases
- quality measures
- classification accuracy
- classification scheme
- support vector
- support vector machine svm
- pattern recognition
- text classification
- feature selection
- image classification
- feature extraction
- feature vectors
- training set
- feature space
- benchmark datasets
- decision trees
- machine learning
- probabilistic model
- image retrieval
- classification algorithm
- classification method
- classification rules