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Robust Face Recognition via Minimum Error Entropy-Based Atomic Representation.

Yulong WangYuan Yan TangLuoqing Li
Published in: IEEE Trans. Image Process. (2015)
Keyphrases
  • robust face recognition
  • minimum error
  • face recognition
  • multiscale
  • image representation
  • feature extraction
  • pairwise
  • support vector machine
  • feature analysis
  • varying illumination