Login / Signup

Improving ICs reliability with high speed thermal mapping.

Saverio PanarelloClaudia TrioloF. GaresciSalvatore PatanèG. BillèD. PattiL. BurianD. GazzoS. PetenyiC. Ribellino
Published in: SMACD (2017)
Keyphrases
  • high speed
  • low power
  • database
  • infrared
  • real time
  • information systems
  • neural network
  • path planning
  • finite element analysis