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Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM.

H. SatoH. M. ShinH. JungS. W. LeeH. BaeH. KwonK. H. RyuW. C. LimY. S. HanJ. H. JeongJ. M. LeeD. S. KimK. LeeJ. H. LeeJ. H. ParkY. J. SongY. JiB. I. SeoJ. W. KimH. H. Kim
Published in: IRPS (2023)
Keyphrases
  • prediction accuracy
  • design considerations
  • high reliability
  • wide range
  • structural properties
  • prediction algorithm
  • power system
  • prediction error
  • low voltage
  • physico chemical
  • real time
  • cost effective