Using Bayesian network technology to predict the semiconductor manufacturing yield rate in IoT.
Xiaodong FangChan ChangGenggeng LiuPublished in: J. Supercomput. (2021)
Keyphrases
- semiconductor manufacturing
- bayesian networks
- discrete event simulation
- process control
- case study
- neural network
- management system
- probabilistic model
- data mining
- learning bayesian networks
- graphical models
- data processing
- structure learning
- big data
- rapid development
- key technologies
- conditional independence
- data sets
- bayesian network inference
- causal relationships
- cost effective
- random variables
- sensor networks
- control system
- expert systems
- web services