Deep-Learning-Based Image Reconstruction and Enhancement in Optical Microscopy.
Kevin de HaanYair RivensonYichen WuAydogan OzcanPublished in: Proc. IEEE (2020)
Keyphrases
- image reconstruction
- deep learning
- unsupervised learning
- super resolution
- machine learning
- mental models
- image analysis
- reconstruction method
- emission computed tomography
- image processing
- high resolution
- emission tomography
- image reconstruction algorithms
- pattern recognition
- high quality
- weakly supervised
- data mining
- sparsely sampled