Combining DEKF algorithm and trace rule for fast on-line invariance extraction and recognition.
Sheng-Jiang ChangKwok-Wo WongAndrew Chi-Sing LeungPublished in: Pattern Recognit. Lett. (2000)
Keyphrases
- recognition algorithm
- experimental evaluation
- learning algorithm
- detection algorithm
- computational complexity
- worst case
- improved algorithm
- computational cost
- times faster
- np hard
- cost function
- particle swarm optimization
- object recognition
- image matching
- k means
- expectation maximization
- matching algorithm
- linear programming
- recognition accuracy
- handwritten digits
- classification algorithm
- tree structure
- optimization algorithm
- high accuracy
- probabilistic model
- dynamic programming
- feature extraction