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Industrial Experiences from SCM Current State Analysis.

Tua RahikkalaJorma TaramaaAntti Välimäki
Published in: SCM (1998)
Keyphrases
  • machine learning
  • case study
  • image analysis
  • statistical analysis
  • industrial applications
  • automatic analysis
  • information retrieval
  • database systems
  • wide range
  • artificial neural networks
  • search space