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Combining statistical analysis and artificial neural network for classifying jobs and estimating the cycle times in wafer fabrication.
Toly Chen
Published in:
Neural Comput. Appl. (2015)
Keyphrases
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wafer fabrication
statistical analysis
artificial neural networks
dispatching rule
neural network
statistical analyses
statistical methods
back propagation
clinical data
input variables
considerable increase
simulated annealing
automatic classification
rigid body