Radiation Hardened Design of STT-MRAM with High Recoverability from Double Node Upset.
Bo WuKaili ZhangPeng WuDeming ZhangYou WangPublished in: ICTA (2021)
Keyphrases
- design considerations
- wide range
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- user interface
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- artificial intelligence
- design decisions
- computer aided
- high precision
- design process
- case study
- neural network
- software engineering
- infrared
- database systems
- three dimensional
- knowledge base
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- memory management