Sensitivity of reliability growth models to operational profile errors.

Adalberto Nobiato Crespo Paolo Matrella Alberto Pasquini

Published in: ISSRE (1996)

Keyphrases

bayesian framework
modeling framework
real time
complex systems
experimental data
data sets
neural network
information retrieval
artificial intelligence
decision making
clustering algorithm
probabilistic model
graphical models
parameter estimation
error analysis