Advanced method to refine waveform smeared by jitter in waveform sampler measurement.
Hideo OkawaraPublished in: ITC (2013)
Keyphrases
- mutual information
- cross correlation
- clustering method
- high accuracy
- similarity measure
- pairwise
- cost function
- synthetic data
- detection method
- objective function
- preprocessing
- significant improvement
- high precision
- experimental evaluation
- classification accuracy
- segmentation method
- support vector machine svm
- monte carlo
- prior information
- image registration
- segmentation algorithm
- markov chain
- data sets
- computational cost
- dynamic programming
- feature selection
- neural network