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Stuck in the MOS pit: A critical analysis of MOS test methodology in TTS evaluation.
Ambika Kirkland
Shivam Mehta
Harm Lameris
Gustav Eje Henter
Éva Székely
Joakim Gustafson
Published in:
SSW (2023)
Keyphrases
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neural network
real time
data mining
data analysis
expert systems
image analysis
low cost
high speed
evaluation metrics
evaluation criteria