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Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices.

Qingkui YuYi SunZheng LiBo MeiXiaoliang LiHe LvPengwei LiMin Tang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • simulation study
  • search algorithm
  • monte carlo
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  • markov random field
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