Login / Signup
A New Zero-Overhead Test Method for Low-Power AI Accelerators.
Sangjun Lee
Jongho Park
Sungwhan Park
Hyemin Kim
Sungho Kang
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2024)
Keyphrases
</>
low power
low cost
power consumption
single chip
image processing
high speed