Login / Signup
Due-date performance improvement using TOC's aggregated time buffer method at a wafer fabrication factory.
Tsai-Chi Kuo
Sheng-Hung Chang
Shang-Nan Huang
Published in:
Expert Syst. Appl. (2009)
Keyphrases
</>
significant improvement
high accuracy
cost function
detection method
neural network
dynamic programming
genetic algorithm
computational complexity
pairwise
experimental evaluation
probabilistic model
high precision