Integrating support vector machine and genetic algorithm to implement dynamic wafer quality prediction system.
Pao-Hua ChouMenq-Jiun WuKuang-Ku ChenPublished in: Expert Syst. Appl. (2010)
Keyphrases
- quality prediction
- genetic algorithm
- support vector machine
- feature selection
- image quality
- multi class
- neural network
- dynamic environments
- multi objective
- training data
- k nearest neighbor
- evolutionary algorithm
- information systems
- kernel methods
- optimal parameters
- knn
- database
- support vector
- classification method
- massively parallel
- encoding scheme
- machine learning