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Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm Process Technology.

Langtao ChenXin ZhouYing WangYing KongRubin XieLing PengYantu MoMing QiaoBo Zhang
Published in: APCCAS (2022)
Keyphrases
  • neural network
  • rapid development
  • database
  • data sets
  • artificial intelligence
  • social networks
  • case study
  • statistical analysis
  • process model
  • simulation study
  • secondary school
  • positive effects
  • events occurring