A method for bipolar semiconductor device modeling implementable in circuit simulators.
Armando S. AraújoAdriano CarvalhoJ. L. Martins de CarvalhoPublished in: ICECS (1998)
Keyphrases
- detection method
- high accuracy
- significant improvement
- preprocessing
- synthetic data
- clustering method
- computationally efficient
- high precision
- segmentation method
- learning algorithm
- theoretical analysis
- optimization algorithm
- detection algorithm
- high speed
- support vector machine
- cost function
- pairwise
- objective function