Login / Signup

Symbolic Approach for Side-Channel Resistance Analysis of Masked Assembly Codes.

Inès Ben El OuahmaQuentin L. MeunierKarine HeydemannEmmanuelle Encrenaz
Published in: PROOFS (2017)
Keyphrases
  • multiscale
  • quantitative analysis
  • machine learning
  • data analysis
  • image analysis
  • databases
  • case study
  • video sequences
  • computational complexity
  • statistical analysis
  • error correcting codes