Cross Validation Through Two-Dimensional Solution Surface for Cost-Sensitive SVM.
Bin GuVictor S. ShengKengYeow TayWalter RomanoShuo LiPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (2017)
Keyphrases
- cross validation
- cost sensitive
- support vector
- binary classification
- multi class
- model selection
- misclassification costs
- cost sensitive learning
- support vector machine
- hyperparameters
- generalization error
- class distribution
- training set
- cost sensitive classification
- binary classifiers
- ls svm
- grid search
- naive bayes
- multi class classification
- optimal solution
- kernel function
- classification accuracy
- active learning
- data sets
- loss function
- knn
- multiclass classification
- rbf kernel