Login / Signup

Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs.

Cosette Y. H. LinRyan H.-M. HuangCharles H.-P. WenAustin C.-C. Chang
Published in: VLSI-DAT (2013)
Keyphrases
  • error rate
  • statistical analysis
  • low cost
  • test set
  • computer vision
  • information theoretic
  • similarity measure
  • training set
  • hypothesis testing