Precise Extraction of Deep Learning Models via Side-Channel Attacks on Edge/Endpoint Devices.
Younghan LeeSohee JunYungi ChoWoorim HanHyungon MoonYunheung PaekPublished in: CoRR (2024)
Keyphrases
- learning models
- learning algorithm
- machine learning
- loss function
- semi supervised learning
- learning tasks
- learning problems
- classification models
- machine learning algorithms
- learning paradigms
- information extraction
- machine learning models
- conditional random fields
- sparse metric learning
- information retrieval
- microarray
- collaborative filtering
- supervised learning
- image processing
- computer vision