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A comparison of various terminal-gate relationships for interconnect prediction in VLSI circuits.
Joni Dambre
Peter Verplaetse
Dirk Stroobandt
Jan Van Campenhout
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2003)
Keyphrases
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vlsi circuits
prediction accuracy
power dissipation
high speed
low power
prediction model
prediction error